A. Balasubramanian, A.L. Sternberg, B.L. Bhuva and L.W.Massengill, “Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS Technologies”, presented at the 2006 IEEE Nuclear and Space Radiation Effects Conference, Ponte Verda Beach, FL, July 2006.

B. D. Olson, O. A. Amusan, S. Dasgupta, L.W. Massengill, A. F. Witulski, B. L. Bhuva, K. M. Warren, and D. R. Ball, “Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Guard Contacts in 130 nm and 90 nm CMOS Technology” by presented at the 2006 Workshop On Radiation Effects On Components and Systems, Athens, GR, September 2006.

C. J. Marshall, P. W. Marshall, C. L. Howe, R.A. Reed, R. A. Weller, M. Mendenhall, A. Waczynski, R. Ladbury, and T. M. Jordan, “Comparison of Measured Dark Current Distributions with Calculated Damage Energy Distributions in HgCdTe”, presented at the 2006 Radiation and its Effects on Components and Systems Conference, Athens, Greece, September 2006.

C.F. Holt, B.L. Bhuva, W.T. Holman, L.W. Massengill, “SETs in Dynamic Logic Circuitry,” presented at the 2006 Single Event Symposium, Long Beach, CA, April 2006.

D. M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, R. D. Schrimpf, and S. T. Pantelides, “Effects of device aging on microelectronics radiation response and reliability,” Proc. 25th International Conf. Microelectron. (MIEL 2006), vol. 1, Belgrade, Serbia and Montenegro, May 14-17, 2006, pp. 89-96. [Invited.]

J. A. Felix, M. R. Shaneyfelt, J. R. Schwank, P. E. Dodd, D. M. Fleetwood, X. J. Zhou, and E. P. Gusev, “The effects of radiation and charge trapping on the reliability of alternative gate dielectrics,” in Defects in Advanced High-κ Dielectric Nano-Electronic Semiconductor Devices, edited by E. Gusev (Springer, Amsterdam, 2006), pp. 299-322. [Invited.]

J. A. Pellish, R. A. Reed, M. L. Alles, R. D. Schrimpf, M. Varadharajaperumal, G. Niu, A. K. Sutton, R. M. Diestelhorst, G.
Espinel, R. Krithivasan, J. P. Comeau, J. D. Cressler, G. Vizkelethy, P. W. Marshall, R. A. Weller, M. H. Mendenhall and E. J. Montes, “Monte Carlo modeling of proton events in deep trench isolation technologies using the combined capabilities of MRED and TCAD”, presented at the Single Event Effects Symposium, Long Beach, CA, April 2006.

J. A. Pellish, R. A. Reed, R. D. Schrimpf, M. L. Alles, M. Varadharajaperumal, G. Niu, A. K. Sutton, R. M. Diestelhorst, G. Espinel, R. Krithivasan, J. P. Comeau, J. D. Cressler, G. Vizkelethy, P. W. Marshall, R. A. Weller, M. H. Mendenhall and E. J. Montes, “Substrate engineering concepts to mitigate charge collection in deep trench isolation technologies” , presented at the 2006 Nuclear and Space Radiation Effects Conference, Ponte Vedra Beach, FL, July 2006.

J. P. Comeau, R. Krithivasan, A. K. Sutton, R. Diestelhorst, G. Espinel, A. P. Gnana Prakash, B. Jun, J. D. Cressler, M. Varadharajaperumal, G. Niu, J. A. Pellish, R. A. Reed, P. W. Marshall and G. Vizkelethy, “An investigation of transistor layout-based SEU hardening of SiGe HBTs” , presented at the conference for Radiation Effects on Components and Systems (RADECS), Athens, Greece, September 2006.

M. Asai, R.A. Reed, R.W. Weller, “Geant4 Applications for NASA Space Missions,” 7th International Conference on Advanced Technology and Particle Physics, Como, Italy, October 15-19 2006.

M. L. Alles, R. Pasternak, N. H. Tolk, R. D. Schrimpf, D. M. Fleetwood, and R. W. Standley, “Experimental Evaluation of Second Harmonic Generation for Non-Invasive Contamination Detection in SOI Wafers”, Proceedings of The 17th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2006.

M. P. Baze, J. Wert, J. W. Clement, M. G. Hubert, A. F. Witulski, O. A. Amusan, L. W. Massengill, D. McMorrow, “Propagating SET Characterization Technique for Digital CMOS Libraries”, presented at the 2006 Nuclear and Space Radiation Effects (NSREC) Conference, Ponte Vedra Beach, FL, July 2006

O. A. Amusan, A. F. Witulski, L.W. Massengill, B. L. Bhuva, P. R. Fleming,M. L. Alles, A. L. Sternberg, J. D. Black, and R. D. Schrimpf, “Charge Collection and Charge Sharing in a 130 nm CMOS Technology” by , presented at the 2006 Nuclear and Space Radiation Effects (NSREC) Conference, Ponte Vedra Beach, FL, July 2006.

R. A. Reed, J. A. Pellish, R. A. Weller, M. Porter, J. Wilkinson, K. M. Warren, B. Sierawski, P. W. Marshall, and R. D. Schrimpf, “Applications of Heavy Ion Microprobe for Single Event Effects Analysis,” presented at Int. Conf. on the Application of Accelerators in Research & Industry, Fort Worth, TX, 2006.

R. A. Reed, R. A. Weller, R. D. Schrimpf, L. W. Massengill, M. H. Mendenhall K. M. Warren D. R. Ball, J. A. Pellish B. D. Sierawski C. L. Howe, M. Alles, A. L. Sternberg A. F. Witulski A. D. Tipton, M. A. Xapsos, K. A. LaBel, “RADSAFE Development and Applications Overview”, presented at the Single Event Effects Symposium, Long Beach, CA, 2006.

R. D. Schrimpf, R. A. Weller, M. H. Mendenhall, R. A. Reed, and L. W. Massengill, “Physical Mechanisms of Single Event Effects in Advanced Microelectronics,” presented at Int. Conf. on the Applications of Accelerators in Research & Industry, Fort Worth, TX, 2006.

R.A. Reed, R.A. Weller, “RADSAFE Development and Applications, An Overview,” presented at the 2006 Single Event Symposium, Long Beach, CA, April 2006.

T.D. Loveless, L.W. Massengill, B.L. Bhuva, W.T. Holman, A.F. Witulski and Y. Boulghassoul, “A Hardened-by-Design Technique for RF Digital Phase-Locked Loops”, presented at the 2006 Nuclear and Space Radiation Effects Conference, Ponte Vedra, FL, July 2006.

T.D. Loveless, L.W. Massengill, B.L. Bhuva, W.T. Holman, A. F. Witulski, and Y. Boulghassoul, “Hardening Options for a RF Digital PLL” , presented at the 2006 SEE Symposium, Long Beach, CA, April 2006.