1996 Conference Presentations
H.G. Parks, R.D. Schrimpf, and K.F. Galloway, “Contamination TCAD: A Tool Needed for Efficient Process Development,” in Digest of Papers 1996 GOMAC Conference, pp. 287-290, 1996.
K.F. Galloway, G.H. Johnson, and R.D. Schrimpf, “Present Status of Power MOSFET Single Event Phenomena: A Review,” in Proc. 2nd Int. Workshop on Radiation Effects of Semiconductor Devices for Space Applications (Invited), pp. 88-98, 1996.
L.W. Massengill, “Cosmic and Terrestrial Single-Event Effects in Dynamic RAMs,” IEEE Trans. On Nuclear Science, vol. NS-43, no. 2, April 1996. (Invited Publication).
M. Allenspach, J. R. Brews, K. F. Galloway, G. H. Johnson, R. D. Schrimpf, R. L. Pease, J. L. Titus, and C. F. Wheatley, “SEGR: A Unique Failure Mode for Power MOSFETs in Spacecraft,” in Proc. of the 7th European Symposium on Reliability of Electron Devices, Failure Physics, and Analysis, 1996.