Radiation Effects and Reliability Group

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1986 Conference Presentations

D. M. Fleetwood (SNL), “Guidelines for Using a 10-keV X-Ray Source for Hardness Assurance”, Proceedings of the 1986 VHSIC/VLSI Qualifications Workshop, Vail, CO, September 9-11, 1986, Palisades Institute for Research Services, Inc., New York, 1986, pp. 395-402.

R.M. Warner, Jr. and R.D. Schrimpf, “BJT-MOSFET Transconductance Comparisons,” in Proc. IEEE Bipolar Circuits and Technology Meeting, 1986, pp. 71-72.

 

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