1992 Conference Presentations
D. Zupac, D. Pote, R.D. Schrimpf, and K.F. Galloway, “Annealing of ESD-Induced Damage in Power MOSFETs,” in Proc. EOS/ESD Symp., 1992, pp. 121-128.
D.B. Mundie and L.W. Massengill, “The Influence of Activation Function Temperature on Weight Decay Effects in Artificial Neural Networks,” Proceedings of the 1992 Workshop on Neural Networks, Auburn, AL, Feb. 10, 1992.
D.B. Mundie and L.W. Massengill, “Threshold Nonlinearity Effects on Weight-Decay Tolerance in Analog Neural Networks,” Proc. of the 1992 Intl. Joint Conf. on Neural Networks, Boston, MA, 1992.
G. Teowee, J.M. Boulton, E.A. Kneer, M.N. Orr, D.P. Birnie III, D.R. Uhlmann, S.C. Lee, K.F. Galloway, and R.D. Schrimpf, “Effect of Zr/Ti Stoichiometry Ratio on the Ferroelectric Properties of Sol-Gel Derived PZT Films,” in Proc. 8th Int. Symp. on the Appl. of Ferroelectrics, 1992, pp. 41-44.
J. R. Schwank, F. W. Sexton, D. M. Fleetwood, M. S. Rodgers, and K. L. Hughes (SNL), “The Response of Metal-Oxide-Semiconductor Devices Irradiated at High Temperatures”, in Space Nuclear Power Systems 1989, eds. M. S. El-Genk and M. D. Hoover (Orbit Book Co., Malabar, FL, 1992), pp. 309-13.
M.L. Alles, L.W. Massengill, S.E. Kerns, K.L. Jones, J.E. Clark, and W.F. Kraus, “Effect of Temperature-Dependent Bipolar Gain Distributions on SEU Vulnerability of SOI CMOS SRAMs,” Proceedings of the 1992 SOI/SOS Conference, November, 1992.
S.C. Lee, G. Teowee, R.D. Schrimpf, D.P. Birnie III, D.R. Uhlmann, and K.F. Galloway, “Fatigue Effect on the I-V Characteristics of Sol-Gel Derived PZT Thin Films,” in Proc. 8th Int. Symp. on the Appl. of Ferroelectrics, 1992, pp. 77-80.