2004 Conference Presentations
C. R. Cirba, J. A. Felix, K. F. Galloway, R. D. Schrimpf, D. M. Fleetwood, and S. Cristoloveanu, “Space-radiation effects in advanced SOI devices and alternative gate dielectrics”, in Future Trends in Microelectronics: the Nano, the Giga, and the Ultra, eds. S. Luryi, J. Xu, and A. Zaslavsky (Wiley, New York, 2004), pp. 115-126.
D. Lunardini, B. Narasimham, V. Ramachandran, V. Srinivasan, R. D. Schrimpf, and W. H. Robinson, “A Performance Comparison between Hardened-by-Design and Conventional-Design Standard Cells”, Presented at RADECS Workshop 2004.
D.J. Cochran, S.P. Buchner, T.L. Irwin, S.D. Kniffin, R.L. Ladbury, C.D. Palor, K.A. LaBel, C.J. Marshall, R.A. Reed, A.B. Sand ers, D.K. Hawkins, R.J. Flanigan, S.R. Cox, M.V. O’Bryan, M.A. Carts, C.F. Poivey, J.W. Howard Jr., H.S. Kim, J.D. Forney, P.W. Marshall, “Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA,” Radiation Effects Data Workshop, 2004 IEEE , 22 July 2004, Pages:19 – 25.
J.C. Pickel, R.A. Reed, P.W. Marshall, A. Wacynski, E. Polidan, S. Johnson, R. McMurray, M. McKelvey, K. Ennico, R. Johnson, and G. Gee, “Radiation Induced Transient Effects in HgCdTe IR Focal Plane Arrays,” Proc. of the SPIE, Vol. 5487, Conf. on Optical, Infrared, and Millimeter Space Telescopes, edited by John. C. Mather, 2004, pp. 698-709.
M.V. O’Bryan, C.M. Seidleck, M.A. Carts, J.W. Howard Jr., H.S. Kim, J.D. Forney, K.A. Label, C.J. Marshall, R.A. Reed, A.B. Sanders, D.K. Hawkins, S.R. Cox, S.P. Buchner, T.R. Oldham, J. Sutton, T.L. Irwin, E. Rodriguez, D. McMorrow, S.D. Kniffin, R.L. Ladbury, M. Walter, C. Palor, P.W. Marshall, M. McCall, S. Meyer, J. Lintz, J. Rodgers, S. Mohammed, D. Rapchun, “Current single event effects results for candidate spacecraft electronics for NASA,” Radiation Effects Data Workshop, 2004 IEEE , 22 July 2004, Pages:10 – 18.
R. D. Schrimpf, R. A. Weller, and R. A. Reed, “Physically Based Simulation of Single-Event Effects in Advanced Technologies,” in Proc. 6th Int. Workshop on Radiation Effects on Semiconductor Devices for Space Application, pp. 99-104, Tsukuba, Japan, October 6-8, 2004.
S.D. Kniffin, J.F. McCabe, G.A. Gardner, J. Lintz, C. Ross, K. Golke, B. Bums, A.B. Sanders, R.A. Reed, K.A. LaBel, P.W. Marshall, S.T. Liu, H.S. Kim, J.D. Forney, C.J. Tabbert, M.A. Carts, J.W. Swonger, “Angular effects in proton-induced single-event upsets in silicon-on-sapphire and silicon-on-insulator devices,” Radiation Effects Data Workshop, 2004 IEEE , 22 July 2004, Pages:115 – 119.