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Posts Tagged ‘Single-Event’

Cloudy with a Chance of Solar Flares: Quantifying the Risk of Space Weather

Dr. Bharat Bhuva’s presentation at the 2017 meeting of the American Association for the Advancement of Science in Boston, on Friday, February 17, has been gaining attention from online consumer electronics magazines. His presentation was quoted by Electronic Component News, in their article “Particles from Outer Space Are Wreaking Low-Grade Havoc On Personal Electronics.” Dr....... KEEP READING

Posted on Monday, February 20th, 2017 in Related News | Tags: , , , , , , , , Comments Off on Cloudy with a Chance of Solar Flares: Quantifying the Risk of Space Weather

Solar Flares, Muons and Microelectronics – What’s the Connection?

Original Article Source This week has seen an intense period of activity from the Sun, with four colossal solar flares in 24 hours. Here on Earth, such spectacular solar displays seem far enough away but in fact these extra-terrestrial events are a cause for concern in our modern digital world. Of concern are so called...... KEEP READING

Posted on Thursday, May 23rd, 2013 in Events, News | Tags: , , , , , , , Comments Off on Solar Flares, Muons and Microelectronics – What’s the Connection?

Technology Scaling and Soft Error Reliability – IRPS 2012 Invited Talk by Dr. Lloyd Massengill

Dr.  Lloyd Massengill, Director of Engineering at the Institute for Space and Defense Electronics (ISDE), will be giving an invited talk on Technology Scaling and Soft Error Reliability at the 2012 IEEE International Reliability Physics Symposium.  The paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability. The influence of ionizing...... KEEP READING

Posted on Thursday, April 12th, 2012 in News | Tags: , , , , , , Comments Off on Technology Scaling and Soft Error Reliability – IRPS 2012 Invited Talk by Dr. Lloyd Massengill

Did Bad Memory Chips Down Russia’s Mars Probe?

http://spectrum.ieee.org/aerospace/space-flight/did-bad-memory-chips-down-russias-mars-probe... KEEP READING

Posted on Thursday, February 23rd, 2012 in Related News | Tags: , , , Comments Off on Did Bad Memory Chips Down Russia’s Mars Probe?

Resisting Radiation

Article on radiation effects published Fall of 2009 in Vanderbilt’s Engineering Magazine. Resisting Radiation As electronics advance, so do radiation effects and reliability research. By JoAnne Lamphere Beckham, BA’62 How do you design a sunscreen for a computer chip? For that matter, why would you need to? Lloyd Massengill, professor of electrical engineering and computer...... KEEP READING

Posted on Tuesday, September 1st, 2009 in News | Tags: , , , , , , , , , Comments Off on Resisting Radiation

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