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Posts Tagged ‘Electronics’

Technology Scaling and Soft Error Reliability – IRPS 2012 Invited Talk by Dr. Lloyd Massengill

Dr.  Lloyd Massengill, Director of Engineering at the Institute for Space and Defense Electronics (ISDE), will be giving an invited talk on Technology Scaling and Soft Error Reliability at the 2012 IEEE International Reliability Physics Symposium.  The paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability. The influence of ionizing...... KEEP READING

Posted on Thursday, April 12th, 2012 in News | Tags: , , , , , , Comments Off


Galloway is President-Elect of the American Society for Engineering Education

Original Article Source Kenneth F. Galloway has been elected to serve as president-elect of the American Society for Engineering Education.  Galloway is dean of the School of Engineering and professor of electrical engineering. He will become president-elect at the 2012 Annual Conference June 10-13 in San Antonio, Texas, and will assume the presidency in June...... KEEP READING

Posted on Tuesday, April 10th, 2012 in Related News | Tags: , , , , Comments Off


An Award-Worthy Look at Electronic Glitches

An Award-Worthy Look at Electronic Glitches Beginning in 1995 TRIUMF has built up several beam lines that provide low-intensity, energetic proton and neutron beams to simulate natural-radiation exposures either in space or terrestrial environments. Even at low intensity, a few minutes of exposure in these beams can correspond to years of operation in space, air,...... KEEP READING

Posted on Tuesday, March 27th, 2012 in Related News | Tags: , , , , , , , , Comments Off


CubeSat Development

Vanderbilt researchers are launching satellites into space to test the radiation effects on electronic components in order to predict and prevent future failures of such devices. Funded by NASA, these radiation effects test bed payloads will be among the first of their kind in the United States at their scheduled launches in 2013. It’s an...... KEEP READING

Posted on Friday, March 9th, 2012 in | Tags: , , , , , , , , , , , , , Comments Off


Did Bad Memory Chips Down Russia’s Mars Probe?

http://spectrum.ieee.org/aerospace/space-flight/did-bad-memory-chips-down-russias-mars-probe... KEEP READING

Posted on Thursday, February 23rd, 2012 in Related News | Tags: , , , Comments Off


Ron Schrimpf

Ron Schrimpf is a Professor of Electrical Engineering at Vanderbilt University , where his research activities focus on microelectronics and semiconductor devices. In particular, he has a very active research program dealing with the effects of radiation on semiconductor devices and integrated circuits. The Radiation Effects Research Group at Vanderbilt is the largest of its...... KEEP READING

Posted on Thursday, November 3rd, 2011 in | Tags: , , , , Comments Off


Background

The Radiation Effects Group (RER) at Vanderbilt University was established in 1987 and is the largest program of its kind in the U.S.  It is the only academic program actively involved in supporting the Department of Defense (DOD) in radiation effects for strategic applications, and one of a very few programs involved in microelectronics research...... KEEP READING

Posted on Tuesday, August 16th, 2011 in | Tags: , , , , , , , , Comments Off