Home » DTRA/NRO Review – 12-13 May 2015

DTRA/NRO Review – 12-13 May 2015


The spring DTRA & NRO Joint Radiation-Hardened Microelectronics Program Review and RHBD Workshop will be held at Vanderbilt University in Nashville TN on 12-13 May 2015 (Tuesday and Wednesday).  You are cordially invited to attend.

The meeting will review Vanderbilt University’s advanced technology radiation assessment and rad-hard-by-design work under the support of DTRA and NRO.  There will also be briefings from other organizations and entities on related work.

Technical topics will span:

  • 32nm to 14nm rad-effects investigations (SOI, bulk, FDSOI, FinFET, and planar technologies) including TID, SEU, and SEE
  • GaN technologies
  • Rad-hard analog/mixed-signal design
  • Radiation effects mechanisms in RF technologies
  • Rad-hard digital design
  • Radiation-enabled TCAD modeling
  • Radiation-aware EDA modeling
  • Sub-14nm technology assessment

We will meet in Featheringill Hall Room 134 (School of Engineering lecture hall) on the main Vanderbilt campus.

Click for campus map and campus (pay) parking information.

Off campus free parking is available at ISDE, a 20 minute walk away from the meeting site.  Click here for further information and a shuttle update.

Hotel information may be found at: http://www.isde.vanderbilt.edu/wp/location/hotel-information/

The ISDE web page is: http://www.isde.vanderbilt.edu/

Click HERE for the agenda.

We hope to see you in Nashville in May.


Lloyd W. Massengill
Professor – Electrical and Computer Engineering
Director of Engineering – Vanderbilt Institute for Space and Defense Electronics
Vanderbilt University