Home » DTRA/NRO Review – 12-13 May 2015
DTRA/NRO Review – 12-13 May 2015
The spring DTRA & NRO Joint Radiation-Hardened Microelectronics Program Review and RHBD Workshop will be held at Vanderbilt University in Nashville TN on 12-13 May 2015 (Tuesday and Wednesday). You are cordially invited to attend.
The meeting will review Vanderbilt University’s advanced technology radiation assessment and rad-hard-by-design work under the support of DTRA and NRO. There will also be briefings from other organizations and entities on related work.
Technical topics will span:
- 32nm to 14nm rad-effects investigations (SOI, bulk, FDSOI, FinFET, and planar technologies) including TID, SEU, and SEE
- GaN technologies
- Rad-hard analog/mixed-signal design
- Radiation effects mechanisms in RF technologies
- Rad-hard digital design
- Radiation-enabled TCAD modeling
- Radiation-aware EDA modeling
- Sub-14nm technology assessment
We will meet in Featheringill Hall Room 134 (School of Engineering lecture hall) on the main Vanderbilt campus.
Off campus free parking is available at ISDE, a 20 minute walk away from the meeting site. Click here for further information and a shuttle update.
Hotel information may be found at: http://www.isde.vanderbilt.edu/wp/location/hotel-information/
The ISDE web page is: http://www.isde.vanderbilt.edu/
Click HERE for the agenda.
We hope to see you in Nashville in May.
Lloyd W. Massengill
Professor – Electrical and Computer Engineering
Director of Engineering – Vanderbilt Institute for Space and Defense Electronics