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Cloudy with a Chance of Solar Flares: Quantifying the Risk of Space Weather

Posted by on Monday, February 20, 2017 in Related News.

Dr. Bharat Bhuva’s presentation at the 2017 meeting of the American Association for the Advancement of Science in Boston, on Friday, February 17, has been gaining attention from online consumer electronics magazines. His presentation was quoted by Electronic Component News, in their article “Particles from Outer Space Are Wreaking Low-Grade Havoc On Personal Electronics.” Dr. Bhuva was also quoted in a Computer World article, “Computer Crashes May be Due to Forces Beyond Our Solar System,” published on Friday, February 17. The discussion of his presentation really started to take off when the Computer World article was linked on the front page of Slashdot.org on Sunday, February 19. Additionally, Dr. Jonathan Pellish, an engineer from the NASA Goddard Space Flight Center and a Vanderbilt Radiation Effects Research Group alumnus, presented in the same session and discussed mitigation of these effects.

The Vanderbilt University Radiation Effects Research Group, established in 1987, and the Vanderbilt University Institute for Space and Defense Electronics (ISDE), established in 2003, perform research on microelectronic devices and circuits, physical- and circuit-level modeling, and design for high-reliability, mission-critical needs. Combined, the Radiation Effects Research Group and ISDE have expertise in the physical modeling of radiation interaction with semiconductors, radiation-aware EDA model development, radiation-hardened circuit design, and application for system insertion. The Radiation Effects Research Group primarily engages in scientific pursuits and training the next generation of radiation effects engineers. ISDE brings several decades of academic resources/expertise and real-world engineering to bear on customer driven programs. The mission of ISDE is to supply radiation effects models, design tools, and analysis capabilities; provide radiation effects testing; support the design and analysis of radiation-hardened electronics; address system-specific problems related to electronics reliability; and develop radiation hardness assurance test plans. Additionally, ISDE provides training and education related to microelectronics reliability and radiation effects.

If you would like more information about the Radiation Effects Research Group, please contact Ron SchrimpfLloyd Massengill, or Bharat Bhuva.

If you would like more information about the Institute for Space and Defense Electronics, please contact Ron Schrimpf or Mike Alles.

If you would like more information about our test capabilities and/or services, please contact Robert Reed or Jeff Kauppila.

Additional venues discussing this presentation: Vanderbilt NewsPhys.orgDailymailFox 17Engadget, Gizmodo

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