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Posts Tagged ‘Sierawski’
Original Article Source Paper first-authored by engineering graduate student wins IEEE Outstanding Conference Paper Award As phones and other electronics shrink in size, they’ve grown in capabilities and ubiquitousness. But, as semiconductors – the omnipresent and indispensable building blocks of the electronics and computer industries – get to the 28 to 45 nanometer feature size...... KEEP READING
Posted on Thursday, January 16th, 2014 in News, Related News | Tags: Broadcom, DTRA, Fleetwood, ISDE, Mendenhall, NASA, NSREC, Reed, RER, Schrimpf, SEU, Sierawski, Sternberg, Texas Instruments, Weller Comments Off on Large University, Industry Team Analyzes Single Electron That Can Zap Technology
Original Article Source This week has seen an intense period of activity from the Sun, with four colossal solar flares in 24 hours. Here on Earth, such spectacular solar displays seem far enough away but in fact these extra-terrestrial events are a cause for concern in our modern digital world. Of concern are so called...... KEEP READING
Posted on Thursday, May 23rd, 2013 in Events, News | Tags: Bhuva, ISDE, Marvell, muon, Radiation Testing, SEU, Sierawski, Single-Event Comments Off on Solar Flares, Muons and Microelectronics – What’s the Connection?
An Award-Worthy Look at Electronic Glitches Beginning in 1995 TRIUMF has built up several beam lines that provide low-intensity, energetic proton and neutron beams to simulate natural-radiation exposures either in space or terrestrial environments. Even at low intensity, a few minutes of exposure in these beams can correspond to years of operation in space, air,...... KEEP READING
Posted on Tuesday, March 27th, 2012 in Related News | Tags: Awards, Electronics, ISDE, Mendenhall, muon, Radiation Testing, Reed, Sierawski, TRIUMF Comments Off on An Award-Worthy Look at Electronic Glitches
Brian Sierawski is a Staff Engineer at the Institute for Space and Defense Electronics at Vanderbilt University. He joined ISDE in January 2005 where his efforts include modeling of semiconductor devices and evaluation of radiation effects using Technology Computer Aided Design (TCAD) simulations. He earned a BSE in Computer Engineering and MSE in Computer Science...... KEEP READING