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Posts Tagged ‘Technology Scaling’
Dr. Lloyd Massengill, Director of Engineering at the Institute for Space and Defense Electronics (ISDE), will be giving an invited talk on Technology Scaling and Soft Error Reliability at the 2012 IEEE International Reliability Physics Symposium. The paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability. The influence of ionizing...... KEEP READING
Posted on Thursday, April 12th, 2012 in News | Tags: Electronics, ISDE, Massengill, Radiation Effects, Single-Event, Soft Error, Technology Scaling Comments Off on Technology Scaling and Soft Error Reliability – IRPS 2012 Invited Talk by Dr. Lloyd Massengill