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Posts Tagged ‘Alles’

Cloudy with a Chance of Solar Flares: Quantifying the Risk of Space Weather

Dr. Bharat Bhuva’s presentation at the 2017 meeting of the American Association for the Advancement of Science in Boston, on Friday, February 17, has been gaining attention from online consumer electronics magazines. His presentation was quoted by Electronic Component News, in their article “Particles from Outer Space Are Wreaking Low-Grade Havoc On Personal Electronics.” Dr....... KEEP READING

Posted on Monday, February 20th, 2017 in Related News | Tags: , , , , , , , , Comments Off on Cloudy with a Chance of Solar Flares: Quantifying the Risk of Space Weather

Collaboration Between Vanderbilt and Startup Femtometrix Leads to Exclusive Deal

Original Source Article An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron Schrimpf, Ph.D.,...... KEEP READING

Posted on Friday, June 28th, 2013 in Related News | Tags: , , , , , , Comments Off on Collaboration Between Vanderbilt and Startup Femtometrix Leads to Exclusive Deal

Michael L. Alles, PhD

Research Professor, EE Associate Director, ISDE Google Scholar Profile Dr. Michael Alles received his Ph.D. (12/92), M.S. (8/90), and B.S. (5/87) degrees in Electrical Engineering from Vanderbilt University. Dr. Alles is a Research Professor of Electrical Engineering, and the Associate Director of the Vanderbilt Institute for Space and Defense Electronics (ISDE). Prior to returning to...... KEEP READING

Posted on Thursday, November 3rd, 2011 in | Tags: , , Comments Off on Michael L. Alles, PhD

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