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Posts Tagged ‘RER’

Large University, Industry Team Analyzes Single Electron That Can Zap Technology

Original Article Source Paper first-authored by engineering graduate student wins IEEE Outstanding Conference Paper Award As phones and other electronics shrink in size, they’ve grown in capabilities and ubiquitousness. But, as semiconductors – the omnipresent and indispensable building blocks of the electronics and computer industries – get to the 28 to 45 nanometer feature size...... KEEP READING

Posted on Thursday, January 16th, 2014 in News, Related News | Tags: , , , , , , , , , , , , , , Comments Off


Alumni

The Radiation Effects Reliability (RER) group has graduates in many Government organizations, Aerospace companies, and Electronics companies throughout the US as well as academic appointments.  ISDE employs many RER graduates as well. The following is a partial list of companies/organizations which employ RER graduates: Accelicon Albany Nanotech Arizona State University ATI Research BAE Systems Broadcom...... KEEP READING

Posted on Wednesday, November 2nd, 2011 in | Tags: , , Comments Off


Background

The Radiation Effects Group (RER) at Vanderbilt University was established in 1987 and is the largest program of its kind in the U.S.  It is the only academic program actively involved in supporting the Department of Defense (DOD) in radiation effects for strategic applications, and one of a very few programs involved in microelectronics research...... KEEP READING

Posted on Tuesday, August 16th, 2011 in | Tags: , , , , , , , , Comments Off