Home » Posts tagged 'RER'
Posts Tagged ‘RER’
Original Article Source Paper first-authored by engineering graduate student wins IEEE Outstanding Conference Paper Award As phones and other electronics shrink in size, they’ve grown in capabilities and ubiquitousness. But, as semiconductors – the omnipresent and indispensable building blocks of the electronics and computer industries – get to the 28 to 45 nanometer feature size...... KEEP READING
Posted on Thursday, January 16th, 2014 in News, Related News | Tags: Broadcom, DTRA, Fleetwood, ISDE, Mendenhall, NASA, NSREC, Reed, RER, Schrimpf, SEU, Sierawski, Sternberg, Texas Instruments, Weller Comments Off
The Radiation Effects Reliability (RER) group has graduates in many Government organizations, Aerospace companies, and Electronics companies throughout the US as well as academic appointments. ISDE employs many RER graduates as well. The following is a partial list of companies/organizations which employ RER graduates: Accelicon Albany Nanotech Arizona State University ATI Research BAE Systems Broadcom...... KEEP READING
The Radiation Effects Group (RER) at Vanderbilt University was established in 1987 and is the largest program of its kind in the U.S. It is the only academic program actively involved in supporting the Department of Defense (DOD) in radiation effects for strategic applications, and one of a very few programs involved in microelectronics research...... KEEP READING