Dr. Lloyd W. Massengill is Director of Engineering at the Institute for Space and Defense Electronics and Professor of Electrical and Computer Engineering at Vanderbilt University. He has worked for 20 years in the area of radiation effects modeling and hardened circuit design for space and strategic systems. Prof. Massengill has lead teams in rad-hard TCAD development, rad-hard EDA, analog and digital single-event circuit effects modeling, dose-rate effects modeling, and radiation tolerant memory and ADC design. He is presently involved in electronics design hardening for the Trident II D5le life extension program. Education: PhD EE 1987, MSEE 1984, BSEE 1982, North Carolina State University.
- Radiation effects on integrated circuits: specializing in Single Event and Dose Rate effects.
- Circuit design (digital MOS and analog bipolar) for reliable operation in space environments
- SRAM/DRAM designs for military/space applications
- Mixed analog/digital circuit design and simulation: specializing in charge-based circuits
- Analog circuit designs for neural network applications
- Analysis of analog noise processes in digital circuits
- Development of specialized circuit simulation codes for VLSI circuit analysis with an emphasis on reliability
- More than 70 technical publications in the area of radiation effects modeling and circuit hardening.
- Discovered and first modeled the rail span collapse dose-rate failure mechanism in CMOS memories (1984).
- First modeled single-event-induced parasitic bipolar enhancement in partially depleted SOI devices (1991).
- Designed single-event hardened resistive-load and dynamic memory cells (1994).
- Developed a probabilistic technique for tracking the propagation of single event faults in complex combinational circuitry at the VHDL level (1998).
- Developed techniques for dose-rate and single event radiation modeling at the circuit level based on technology computer-aided-design (TCAD) physical simulations (2001).
- Developed TCAD-based radiation effects models for SPAWAR 0.8um SOI and Honeywell 0.25um SOI processes (2001).
- Led the DTRA program that first modeled and characterized analog single event transient propagation effects in operational amplifier circuits (2001).
- Characterized ASETs in the LM124, OP27, and LM119 analog circuits (2002).
- Led a NASA effort investigating single event radiation reliability affected by NTR roadmap scaling of commercial technologies (2000).
- Participated in a study of scaling effects and design techniques affecting single event soft error rates in the Alpha family of microprocessors migrating from the 0.35 to 0.25 technology nodes (2001).
- Led a team investigating single event effects in dynamic logic in aggressively-scaled commercial microprocessor designs (2002).
- One of three Meritorious Paper Awards for the 1993 IEEE Nuclear and Space Radiation Effects Conference
- Short-course instructor for the 1993 IEEE Nuclear and Space Radiation Effects Conference
- Best Engineering School Research Paper Award – Second Place, Vanderbilt School of Engineering, 1991
- One of 10 presentations nominated as Best Presentation of the 1991 IEEE Nuclear and Space Radiation Effects Conference
- One of 10 presentations nominated as Best Presentation of the 1989 IEEE Nuclear and Space Radiation Effects Conference