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Brian Sierawski, PhD

ISDE Research Engineer

Research Assistant Professor

Google Scholar Profile
Dr. Brian Sierawski received his Ph.D. in Electrical Engineering (12/11) from Vanderbilt University, M.S.E. in Computer Science and Engineering (5/04), and his B.S.E. in Computer Engineering (5/02) from the University of Michigan. Dr. Sierawski is a Research Assistant Professor with Vanderbilt University’s Institute for Space and Defense Electronics (ISDE), where he works in the area of radiation effects modeling and test. Dr. Sierawski joined ISDE in 2005 and focuses on the proper operation of microelectronics in space environments. He developed and administers the CREME website for public access to space radiation environment models and error rate predictions, and maintains the MRED code for Monte Carlo radiation transport simulations. Additionally, he leads the development, assembly, and operation of small-satellite radiation effects experiments.
Highlighted Publications:
B. D. Sierawski, K. M. Warren, A. L. Sternberg, R. A. Austin, J. M. Trippe, M. W. McCurdy, R. A. Reed, R. A. Weller, M. L. Alles, R. D. Schrimpf, L. W. Massengill, D. M. Fleetwood, A. Monteiro, G. W. Buxton, J. C. Brandenburg, W. B. Fisher, and R. Davis, “Cubesats and crowd-sourced monitoring for single event effects hardness assurance,” IEEE Trans. Nucl. Sci., vol. 64, no. 1, pp. 293-300, Jan. 2017, DOI:10.1109/TNS.2016.2632440
B. D. Sierawski, J. A. Pellish, R. A. Reed, R. D. Schrimpf, R. A. Weller, M. H. Mendenhall, J. D. Black, A. D. Tipton, M. A. Xapsos, R. C. Baumann, X. Deng, M. R. Friendlich, H. S. Kim, A. M. Phan, and C. M. Seidleck, “Impact of low-energy proton induced upsets on test methods and rate predictions,” IEEE Trans. Nucl. Sci., vol. 56, no. 6, pp. 3085–3092, Dec. 2009, DOI:10.1109/TNS.2009.2032545.
B. D. Sierawski, M. H. Mendenhall, R. A. Reed, M. A. Clemens, R. A. Weller, R. D. Schrimpf, E. W. Blackmore, M. Trinczek, B. Hitti, J. A. Pellish, R. C. Baumann, S.-J. Wen, R. Wong, and N. Tam, “Muon-induced single event upsets in deep-submicron technology,” IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3273–3278, Dec. 2010, DOI:10.1109/TNS.2010.2080689.
J. H. Adams, A. F. Barghouty, M. H. Mendenhall, R. A. Reed, B. D. Sierawski, K. M. Warren, J. W. Watts, and R. A. Weller, “CRÈME: The 2011 revision of the cosmic ray effects on micro-electronics code,” IEEE Trans. Nucl. Sci., vol. 59, no. 6, pp. 3141–3147, Oct. 2012, DOI: 10.1109/TNS.2012.2218831.