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Original Source Article An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron Schrimpf, Ph.D.,...... KEEP READING
Posted on Friday, June 28th, 2013 in Related News | Tags: Alles, Entrepreneur, Innovation, ISDE, Schrimpf, Vanderbilt, VUSE Comments Off on Collaboration Between Vanderbilt and Startup Femtometrix Leads to Exclusive Deal